| 摘要: |
| 方案采用外围设备互连总线在仪器领域的功能扩充（PXI）射频RF模块搭建成一套射频并行测试系统，实现一款采用融合架构的集成化射频放大器芯片的最终测试，解决了测试成本高，测试不稳定等问题；同时提出了一些射频测试的方法用来加快测试效率.最终测试结果表明，该方案的测量结果与测量要求一致，同时又降低了测试成本，具有一定的应用前景和实用价值. |
| 关键词: 外围设备互连总线在仪器领域的功能扩充 射频放大器 自动化测试 并行测试 最终测试 自动化测试设备 |
| DOI：10.3969/J.ISSN.1000-5137.2018.02.010 |
| 分类号:TN407 |
| 基金项目:国家自然科学基金（N61571135） |
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| The development and implementation of low cost radio frequency amplifier chip test solution based on PXI system |
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Yang Zhen1,2
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1.School of Information Science and Technology, Fudan University, Shanghai 200433, China;2.Wireless Test and Measurement Department, Cobham Wireless Technology Shanghai Co., Ltd., Shanghai 200021, China
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| Abstract: |
| This solution is to build a set of radio frequency (RF) parallel test system with PCI extension for instrument (PXI) RF module,and realize the final test of fusion architectural and integrated RF amplifier chip.It can solve the high cost and instability of test at the same time.It also put forward some RF test methods to increase the test efficiency.The results show that the measurement results of the solution are consistent with the measurement requirement,meanwhile the solution reduces the testing cost and has certain application prospect and practical value. |
| Key words: PCI extension for instrument radio frequency amplifier automatic test parallel test final test automatic test equipment |
